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Re: Breakdown voltage at submillimeter distances?
Original poster: Bert Hickman <bert.hickman@xxxxxxxxxx>
Tesla list wrote:
Original poster: Robert Clark <bobbygc2001@xxxxxxxxx>
Actually I'm interested in the results at a few
microns. I found this after a web search:
"Under constant atmospheric conditions, it is found
that the breakdown voltage of a uniform field gap may
be expressed in the form:
V = A*d + B*SQRT(d) where d is the gap spacing
[i.e., in centimenters - Bob]
For air under normal conditions:
A = 24.4kV/cm
B = 6.29kV/cm^1/2"
Anyone know if this formula would apply or know a
more accurate formula at the micron scale?
Bob Clark
Hello Bob,
There are a few recent experimental studies that
indicate that, for gap distances of less than
~4-6 microns in air at STP, breakdown voltage
diverges from the climbing curve seen in the left
half of the Paschen curve. Instead of climbing,
breakdown voltage declines for decreasing gaps
for gaps smaller than ~4-6 microns (at about the Paschen minimum of 325 volts).
One study (1) shows an approximately linear
decline, while another (2) shows a linear ( for
gaps of less than <2.5 microns) or a logarithmic
decline (gaps between 2.5 to 40 microns). The
source of electrons supporting avalanche
breakdown is apparently field emission
(Fowler-Nordheim tunneling) from the cathode due to the extremely high E-field.
Reference 1 estimates breakdown voltage in the region between 0 - 4 microns as:
Vb = K1*d
where K1 is between 65 and 110 V/micron and d is in microns.
Reference 2 estimates breakdown (for gaps greater than 2.5 microns) as:
Vb = 120*ln(d) + 62 (for 2.5 < d < 40 microns)
and
Vb ~ 70*d (for d <= 2.5 microns
Reference 3 showed variations in the breakdown
voltage curve depending on electrode material
(the study used nickel, brass, iron, copper, and aluminum electrodes).
The references are:
1. Slade, P.G.; Taylor, E.D., "Electrical
breakdown in atmospheric air between closely
spaced (0.2 μm-40 μm) electrical contacts",
Electrical Contacts, 2001. Proceedings of the
Forty-Seventh IEEE Holm Conference on Publication
Date: 10-12 Sept. 2001, Pages 245 - 250. Shows
fairly linear decline for 5 micron gaps or less.
2. Lee, R. T.; Chung, H. H.; Chiou, Y. C., "Arc
erosion behaviour of silver electric contacts in
a single arc discharge across a static gap",
Science, Measurement and Technology, IEE
Proceedings, Jan 2001, Volume 148, Issue 1, pages 8-14
3. J-M Torres and R S Dhariwal, "Electric field
breakdown at micrometre separations", Nanotechnology, 1999, Vol 10 102-107
Bert
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